| ![]() « Back Benefits of 3D GD&T semantic interoperability in the Digital thread: 3D MB Design, Manufacturing and Metrology http://download.afnet.fr/ASD2019/ASD2019-04a-PierreDuchier.pdf Presentation made by Pierre Duchier (CIMPA) and Lenin Sevilla Garcia (Safran) at AFNeT standarisation days 2019 |